Atomic Force Microscopy (AFM) maps surface topography and material properties with sub-nanometer spatial resolution. A micro-cantilever with an atomically sharp tip oscillates near its resonant frequency (f_res) in tapping mode above a sample. Interatomic van der Waals forces modulate the cantilever oscillation amplitude, which is detected via optical lever laser deflection off the mirrored back of the cantilever onto a position-sensitive photodiode.